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Optical interference real-time film thickness monitor AvaThinfilm

A tabletop optical interference real-time film thickness monitor that allows for easy measurement of film thickness. Capable of measuring film thickness from 10 nm to 50 μm. Since it is a spectrometer, it can also perform various other measurements.

A compact and user-friendly spectrometer system that allows for easy measurement of thin film thickness on a tabletop. The spectrometer can also be used for laser measurements and various other applications by simply changing the fiber, which is an attractive feature. Measurements are taken using the interference pattern of white light reflected from the sample, and the software calculates the n and k values from a database. Configuration: ● Spectrometer: AvaSpec-ULS2048CL-EVO ● Light source: AvaLight-DHc ● Software: AvaSoft-thinfilm ● Fiber: FCR-7UV200-M ● Accessory: Thinfilm Stage These components can be controlled from a PC to measure film thickness from 10 nm to 50 μm with a resolution of 1 nm.

  • Analytical Equipment and Devices

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